Competences

Extensive experience in cross-sectional and plane-view preparation of semiconductors, metals, polymers and nanosystems and their characterization. Within the first 15 months after the installation of the first TEM the following materials systems were analyzed (ca. 1 TB of raw data):

• Nanopatterned Si surfaces
• ZnO films on sapphire
• Metal films on semiconductors
• ZnO tetrapods and nanowires
• Carbon fibers and their interfaces
• Defects and phases in AI base alloys
• Perovskite nanoparticles for solar cells
• ZnO nanowall network hollow body microspheres
• SiO nanopores with Cu catalyst nanoparticles
• Graphene oxide quantum dots
• Block copolymer nanopatterns
• CdTe/CdS core-shell nanoparticles
• Heteroepitaxial InAs/GaAs nanostructures
• Polystyrene nanospheres
• Magnetic fields in Co nanoparticles
• Multilayer magnetic field detector devices
• Half Häusler alloys
• Electric fields in semiconductors
• Au nanoparticles
• Stranski-Krastanov quantum dots in semiconductors
• 316 stainless steel